Reduce the number of functional tests

This commit is contained in:
Joost Rijneveld 2019-01-15 16:50:07 +01:00
父節點 39dfbe4e32
當前提交 8c5f2773cb
沒有發現已知的金鑰在資料庫的簽署中
GPG 金鑰 ID: A4FE39CF49CBC553

查看文件

@ -3,7 +3,7 @@
#include <stdio.h>
#include <string.h>
#define NTESTS 10000
#define NTESTS 100
int test_keys() {
unsigned char key_a[CRYPTO_BYTES], key_b[CRYPTO_BYTES];